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Description
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Tom Wirtz, Olivier De Castro, Jean-Nicolas Audinot, Tatjana Taubitz, Antje Biesemeier; In-situ multi-modal microscopy using finely focused ion and electron (2021-07-30)
***This entry has been automatically imported via OpenAlex by LIST harvest scripts. Please refer to https://doi.org/10.1017/s1431927621001677 for the original and latest version of the publication*** (2026-07-01)
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Keyword
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In situ, Materials science, Electron microscope, Modal, Ion, Focused ion beam, Microscopy, Scanning electron microscope, Nanotechnology, Optics, Chemistry, Physics, Composite material |