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Persistent Identifier
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perma:LIST.IZYBHP |
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Publication Date
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2026-07-06 |
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Title
| Roadmap for focused ion beam technologies [* Cross-Reference *] |
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Other Identifier
| https://doi.org/10.1063/5.0162597
SCOPUS_ID:85181095616 |
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Author
| Höflich, Katja (Leibniz-Institut für Höchstfrequenztechnik) - ORCID: 0000-0003-4088-2928
Hobler, Gerhard (TU Wien) - ORCID: 0000-0002-2140-6101
Allen, Frances I. (Department of Materials Science and Engineering) - ORCID: 0000-0002-0311-8624
Wirtz, Tom (Luxembourg Institute of Science and Technology) - ORCID: 0000-0002-7912-5193
Rius, Gemma (CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM)) - ORCID: 0000-0003-0552-1043
McElwee-White, Lisa (College of Liberal Arts and Sciences) - ORCID: 0000-0001-5791-5146
Krasheninnikov, Arkady V. (HZDR - Helmholtz-Zentrum Dresden-Rossendorf) - ORCID: 0000-0003-0074-7588
Schmidt, Matthias (Helmholtz Zentrum für Umweltforschung) - ORCID: 0000-0002-0161-8326
Utke, Ivo (Empa - Swiss Federal Laboratories for Materials Science and Technology) - ORCID: 0000-0002-9877-2601
Klingner, Nico (HZDR - Helmholtz-Zentrum Dresden-Rossendorf) - ORCID: 0000-0001-9539-5874
Osenberg, Markus (Helmholtz-Zentrum Berlin für Materialien und Energie (HZB)) - ORCID: 0000-0003-0836-627X
Córdoba, Rosa (Universitat de València) - ORCID: 0000-0002-6180-8113
Djurabekova, Flyura (Helsingin Yliopisto) - ORCID: 0000-0002-5828-200X
Manke, Ingo (Helmholtz-Zentrum Berlin für Materialien und Energie (HZB)) - ORCID: 0000-0001-9795-5345
Moll, Philip (Max Planck Institute for the Structure and Dynamics of Matter) - ORCID: 0000-0002-7616-5886
Manoccio, Mariachiara (CNR-Nanotec) - ORCID: 0000-0003-1401-1168
De Teresa, José María (Universidad de Zaragoza) - ORCID: 0000-0001-9566-0738
Bischoff, Lothar (HZDR - Helmholtz-Zentrum Dresden-Rossendorf) - ORCID: 0000-0003-3968-7498
Michler, Johann (Empa - Swiss Federal Laboratories for Materials Science and Technology) - ORCID: 0000-0001-8860-4068
De Castro, Olivier (Luxembourg Institute of Science and Technology) - ORCID: 0000-0001-9968-6695
Delobbe, Anne (Orsay Physics) - ORCID: 0000-0003-0081-6002
Dunne, Peter (IPCMS Institut de Physique et Chimie des Matériaux de Strasbourg) - ORCID: 0000-0003-2370-2059
Dobrovolskiy, Oleksandr V. (Universität Wien) - ORCID: 0000-0002-7895-8265
Frese, Natalie (Universität Bielefeld)
Gölzhäuser, Armin (Universität Bielefeld) - ORCID: 0000-0002-0838-9028
Mazarov, Paul (Raith GmbH) - ORCID: 0000-0003-4401-8352
Koelle, Dieter (Eberhard Karls Universität Tübingen) - ORCID: 0000-0003-3948-2433
Möller, Wolfhard (HZDR - Helmholtz-Zentrum Dresden-Rossendorf)
Pérez-Murano, Francesc (CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM)) - ORCID: 0000-0002-4647-8558
Philipp, Patrick (Luxembourg Institute of Science and Technology) - ORCID: 0000-0001-5219-5178
Vollnhals, Florian (Institute for Nanotechnology and Correlative MicroscopygGmbH) - ORCID: 0000-0001-5743-019X
Hlawacek, Gregor (HZDR - Helmholtz-Zentrum Dresden-Rossendorf) - ORCID: 0000-0001-7192-716X |
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Point of Contact
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LIST RDS (LIST) |
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Description
| The focused ion beam (FIB) is a powerful tool for fabrication, modification, and characterization of materials down to the nanoscale. Starting with the gallium FIB, which was originally intended for photomask repair in the semiconductor industry, there are now many different types of FIB that are commercially available. These instruments use a range of ion species and are applied broadly in materials science, physics, chemistry, biology, medicine, and even archaeology. The goal of this roadmap is to provide an overview of FIB instrumentation, theory, techniques, and applications. By viewing FIB developments through the lens of various research communities, we aim to identify future pathways for ion source and instrumentation development, as well as emerging applications and opportunities for improved understanding of the complex interplay of ion-solid interactions. We intend to provide a guide for all scientists in the field that identifies common research interest and will support future fruitful interactions connecting tool development, experiment, and theory. While a comprehensive overview of the field is sought, it is not possible to cover all research related to FIB technologies in detail. We give examples of specific projects within the broader context, referencing original works and previous review articles throughout. (2023-12-01)
***This entry has been automatically imported via Infodoc(ASO) CSV by LIST harvest scripts. Please refer to https://doi.org/10.1063/5.0162597 for the original and latest version of the dataset and data downloads*** (2026-06-19) |
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Subject
| Physics |
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Keyword
| focused ion beam
FIB
ion beam
focused ion
powerful tool |
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Funding Information
| European Cooperation in Science and Technology: CA19140 |
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Deposit Date
| 2023-12-01 |
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Data Type
| Review |
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Data Source
| Applied Physics Reviews; eISSN: 19319401, vol. 10, n° 4, 2023 |