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Description
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Journal Article Nanoscale Correlative Imaging of Low-Z elements by in-situ Secondary Ion Mass Spectrometry in a Transmission Electron Microscope Get access Santhana Eswara, Santhana Eswara Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, 41, rue du Brill, L-4422 Belvaux, Luxembourg Corresponding author: santhana.eswara@list.lu Search for other works by this author on: Oxford Academic Google Scholar Jelena Lovric, Jelena Lovric Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, 41, rue du Brill, L-4422 Belvaux, Luxembourg Search for other works by this author on: Oxford Academic Google Scholar Tom Wirtz Tom Wirtz Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, 41, rue du Brill, L-4422 Belvaux, Luxembourg Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 1778–1779, https://doi.org/10.1017/S1431927619009620 Published: 01 August 2019 (2019-08-01)
***This entry has been automatically imported via OpenAlex by LIST harvest scripts. Please refer to https://doi.org/10.1017/s1431927619009620 for the original and latest version of the publication*** (2026-07-01)
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Keyword
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Instrumentation (computer programming), Analytics, Library science, Art history, Analytical Chemistry (journal), Nanotechnology, Chemistry, Media studies, History, Engineering physics, Engineering, Computer science, Materials science, Sociology, Data science |