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Description
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Journal Article Characterization of Materials for Energy Storage and Production by Helium Ion Microscopy Coupled to Secondary Ion Mass Spectrometry Get access Jean-Nicolas Audinot, Jean-Nicolas Audinot Advanced Instrumentation for Ion Nano-Analytics, Department of Materials Research and Technology, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg Search for other works by this author on: Oxford Academic Google Scholar Jelena Lovric, Jelena Lovric Advanced Instrumentation for Ion Nano-Analytics, Department of Materials Research and Technology, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg Search for other works by this author on: Oxford Academic Google Scholar Tom Wirtz Tom Wirtz Advanced Instrumentation for Ion Nano-Analytics, Department of Materials Research and Technology, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg Corresponding author: tom.wirtz@list.lu Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 888–889, https://doi.org/10.1017/S1431927619005178 Published: 01 August 2019 (2019-08-01)
***This entry has been automatically imported via OpenAlex by LIST harvest scripts. Please refer to https://doi.org/10.1017/s1431927619005178 for the original and latest version of the publication*** (2026-07-01)
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Keyword
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Characterization (materials science), Ion, Mass spectrometry, Materials science, Secondary ion mass spectrometry, Helium, Field ion microscope, Analytical Chemistry (journal), Nanotechnology, Atomic physics, Chemistry, Physics, Chromatography |